JPH0314437U - - Google Patents
Info
- Publication number
- JPH0314437U JPH0314437U JP7399989U JP7399989U JPH0314437U JP H0314437 U JPH0314437 U JP H0314437U JP 7399989 U JP7399989 U JP 7399989U JP 7399989 U JP7399989 U JP 7399989U JP H0314437 U JPH0314437 U JP H0314437U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor thin
- wavelength
- radiation thermometer
- measured object
- thin films
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010409 thin film Substances 0.000 claims description 6
- 230000005855 radiation Effects 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 claims 3
- 238000001514 detection method Methods 0.000 claims 1
- 230000003287 optical effect Effects 0.000 claims 1
- 230000035945 sensitivity Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
Landscapes
- Radiation Pyrometers (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7399989U JPH0314437U (en]) | 1989-06-23 | 1989-06-23 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7399989U JPH0314437U (en]) | 1989-06-23 | 1989-06-23 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0314437U true JPH0314437U (en]) | 1991-02-14 |
Family
ID=31613306
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7399989U Pending JPH0314437U (en]) | 1989-06-23 | 1989-06-23 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0314437U (en]) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020080368A1 (ja) * | 2018-10-16 | 2020-04-23 | 古河電気工業株式会社 | 温度計測システム、温度計測方法およびレーザ加工装置 |
-
1989
- 1989-06-23 JP JP7399989U patent/JPH0314437U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020080368A1 (ja) * | 2018-10-16 | 2020-04-23 | 古河電気工業株式会社 | 温度計測システム、温度計測方法およびレーザ加工装置 |
| JPWO2020080368A1 (ja) * | 2018-10-16 | 2021-09-16 | 古河電気工業株式会社 | 温度計測システム、温度計測方法およびレーザ加工装置 |
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